Weak localization and correlation effects in thin-film degenerate n -type silicon

Journal of Applied Physics

Volumn 101, Issue 3, 2007, Pages

  Troup, A S ^a   Wunderlich, J ^b   Williams, D A ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b HITACHI CAMBRIDGE LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CORRELATION; SEMICONDUCTOR MATERIALS; SENSORS; THIN FILMS; TRANSPORT PROPERTIES;

CORRELATION EFFECTS; NONMAGNETIC READ-HEAD SENSORS; ULTRAHIGH-DENSITY RECORDING;

SILICON;

EID: 33847108444     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2431681     Document Type: Article

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