Auto-referenced on-die power supply noise measurement circuit

Proceedings of the Custom Integrated Circuits Conference

Volumn 2005, Issue , 2005, Pages 39-42

  Chansungsan, Chaiyuth ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; BANDWIDTH; ELECTRON RESONANCE; POWER SUPPLY CIRCUITS; TELECOMMUNICATION LINKS;

FREQUENCY SPECTRUM; NOISE CHARACTERIZATION; POWER SUPPLY NOISE; RESONANCE PEAKS;

SIGNAL NOISE MEASUREMENT;

EID: 33847097943     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2005.1568602     Document Type: Conference Paper

References (5)

1. H. Aoki et al., "On-ohip voltage noise monitor for measuring voltage bounce in power supply lines using a digital tester," in Microelectronic Test Structures, pp. 112-117, 2000.
2. A. Muhtaroglu, G. Taylor, T. Rahal-Arabi, and K. Callaham "On-die noise detector for analog sensing of power supply noise," Symposium on VLSI Circuit Digest of Technical Paper, pp. 193-196, 2003.
3. E. Alon et al., "Circuits and techniques for high-resolution measurement of on-chip power supply noise," Symposium on VLSI Circuit Digest of Technical Paper, pp. 102-105, 2004.
4. C. Chansungsan, "On-die power supply noise measurement circuit," US patent application, P17521, 2003.
5. A.E. Buck et al.,"A CMOS bandgap reference without resistors," IEEE Journal of Solid-State Circuits, vol.37, pp.81-83, No. 1, January 2002.