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Volumn 9, Issue 1-2, 2007, Pages 31-37

Measuring the plastic zone size by Orientation Gradient Mapping (OGM) and Electron Channeling Contrast Imaging (ECCI)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; DISLOCATIONS (CRYSTALS); GRADIENT METHODS; IMAGE ANALYSIS; NONDESTRUCTIVE EXAMINATION; TOPOLOGY;

EID: 33847064320     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.200600195     Document Type: Article
Times cited : (30)

References (10)
  • 4
    • 0003594630 scopus 로고    scopus 로고
    • in Electron Backscatter Diffraction in Mater. Sci. Kluwer Academic/Plenum Publishers
    • E. M. Lehockey, Y. Lin, O. E. Lepik, in Electron Backscatter Diffraction in Mater. Sci. Kluwer Academic/Plenum Publishers, New York 2000, 247-264.
    • (2000) New York , pp. 247-264
    • Lehockey, E.M.1    Lin, Y.2    Lepik, O.E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.