Bias effects on RF passive structures in HR Si substrates

2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers

Volumn 2006, Issue , 2006, Pages 334-337

  Lederer, D ^a   Raskin, J P ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

CPW; Crosstalk; HR silicon; Oxide charges; Quality factor; RF analysis; Substrate losses; Surface conduction

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC INDUCTORS; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; WAVEGUIDES;

CPW; CROSSTALKS; HR SILICON; OXIDE CHARGES; QUALITY FACTORS; RF ANALYSIS; SUBSTRATE LOSSES; SURFACE CONDUCTION;

PASSIVE NETWORKS;

EID: 33847016498     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.2005.1587987     Document Type: Conference Paper

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