Image quality assessment metrics based on multi-scale edge presentation

IEEE Workshop on Signal Processing Systems, SiPS: Design and Implementation

Volumn 2005, Issue , 2005, Pages 331-336

  Zhai, Guangtao ^a   Zhang, Wenjun ^a   Yang, Xiaokang ^a   Xu, Yi ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; IMAGE PROCESSING; PATTERN MATCHING; SIGNAL FILTERING AND PREDICTION; SIGNAL TO NOISE RATIO; WAVELET TRANSFORMS;

EDGES ANALYSES; IMAGE QUALITY ASSESSMENT; PSNR; UNDECIMATED DYADIC WAVELET TRANSFORM;

IMAGE QUALITY;

EID: 33846952807     PISSN: 15206130     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SIPS.2005.1579888     Document Type: Conference Paper

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