Simulating imaging with the scanning ion-conductance microscope

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings

Volumn 7 VOLS, Issue , 2005, Pages 3410-3413

  Adenle, Omolabake A ^b   Fitzgerald, William J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTROLYTES; IONIC CONDUCTION; MATHEMATICAL MODELS;

GAUSSIAN-BUMP SUBSTRATES; SCANNING ELECTROCHEMICAL MICROSCOPE (SECM); SIMULATED APPROACH-CURVES;

IMAGE ANALYSIS;

EID: 33846933978     PISSN: 05891019     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iembs.2005.1617210     Document Type: Conference Paper

References (8)

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