Electrical and optical properties of C46H22N8O4KM (M{double bond, long}Co, Fe, Pb) molecular-material thin films prepared by the vacuum thermal evaporation technique

Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

Volumn 66, Issue 3, 2007, Pages 561-567

  Sanchez Vergara M E ^a   Ruiz Farfan M A ^a   Alvarez J R ^a   Ponce Pedraza, A ^a   Ortiz, A ^b   Alvarez Toledano C ^c  

^a SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

^b INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Anisotropy; Electrical properties and measurements; Organic semiconductors

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CARBON INORGANIC COMPOUNDS; ELECTRIC PROPERTIES; EVAPORATION; INFRARED SPECTROSCOPY; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; POTASSIUM; SCANNING ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY; VACUUM APPLICATIONS;

METALLIC PHTHALOCYANINES (PCS); PHTHALOCYANINES (PCS); POTASSIUM SALT; VACUUM THERMAL EVAPORATION;

THIN FILMS;

COBALT; IRON; LEAD; METAL; ORGANOMETALLIC COMPOUND;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRIC CONDUCTIVITY; INFRARED SPECTROPHOTOMETRY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; ULTRAVIOLET SPECTROPHOTOMETRY; VACUUM; VOLATILIZATION;

COBALT; ELECTRIC CONDUCTIVITY; IRON; LEAD; METALS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; ORGANOMETALLIC COMPOUNDS; SPECTROPHOTOMETRY, INFRARED; SPECTROPHOTOMETRY, ULTRAVIOLET; TEMPERATURE; VACUUM; VOLATILIZATION;

EID: 33846904987     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2006.03.040     Document Type: Article

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