Influence of grating parameters on the linewidths of external-cavity diode lasers

Applied Optics

Volumn 45, Issue 36, 2006, Pages 9191-9197

  Loh, Huanqian ^a   Lin, Yu Ju ^a   Teper, Igor ^a   Cetina, Marko ^a   Simon, Jonathan ^b   Thompson, James K ^a   Vuletić, Vladan ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; DIFFRACTION GRATINGS; NATURAL FREQUENCIES; REFLECTION; SIGNAL NOISE MEASUREMENT;

FREQUENCY NOISE MEASUREMENTS; GRATING REFLECTIVITY; GRATING RESOLUTION; LINEWIDTHS;

SEMICONDUCTOR LASERS;

EID: 33846889947     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.009191     Document Type: Article

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