Analysis of the linewidth of a grating-feedback GaAlAs laser

IEEE Journal of Quantum Electronics

Volumn 36, Issue 10, 2000, Pages 1193-1198

  Genty, G ^a   Grohn A ^a,b   Talvitie, H ^a,c   Kaivola, M ^a   Ludvigsen, H ^a  

^a AALTO UNIVERSITY   (Finland)

^b NOKIA RESEARCH CENTER   (United States)

^c VAISALA OYJ   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; LASER TUNING; LIGHT MEASUREMENT; LIGHT REFLECTION; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING;

EXTERNAL CAVITY MODEL; GALLIUM ALUMINUM ARSENIDE LASER; GRATING FEEDBACK LASER; LASER FREQUENCY TUNING; LINEWIDTH MEASUREMENT; SELF HOMODYNE TECHNIQUE; SHORT DELAY LINE;

SEMICONDUCTOR LASERS;

EID: 18844481906     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.880660     Document Type: Article

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