Characterization of high impedance surfaces using magnitude measurements

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Volumn 1 B, Issue , 2005, Pages 640-643

  Amert, Tony ^a   Glover, Brian ^a   Whites, Keith W ^a  

^a South Dakota School of Mines and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846874775     PISSN: 15223965     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APS.2005.1551641     Document Type: Conference Paper

References (4)

1. D. Sievenpiper, "High-Impedance Electromagnetic Surfaces," Ph.D. dissertation, University of California, Los Angeles, 1999.
2. N. Engheta, "Thin absorbing screens using metamaterial surfaces," IEEE Antennas and Propagat. Soc. Int. Symp., vol. 2, pp. 392-395, 2002.
3. K. W. Whites and C. Y. Chung "Composite uniaxial bianisotropic chiral materials characterization: Comparison of predicted and measured scattering," J. of Electromagn. Waves Appl., vol. 11, 371-394, 1997.
4. Microwave Studio, ver. 5. CST of America, Inc., Wellesley, MA, 2005.