Insulator surface charge measurement using an improved capacitive probe

Plasma Science and Technology

Volumn 8, Issue 5, 2006, Pages 565-568

  Wang, Feng ^a,b   Qiu, Yuchang ^a   Li, Xinran ^b   Pfeiffer, W ^c   Kuffel, E ^d  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b HUNAN UNIVERSITY   (China)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITY OF MANITOBA   (Canada)

Author keywords

Capacitive probe; Insulator; Surface charge

Indexed keywords

CAPACITANCE; ERROR ANALYSIS; LEAKAGE CURRENTS; MEASUREMENT THEORY; PROBES; SURFACE PHENOMENA;

CAPACITIVE PROBE; LOW CHARGE LEAKAGE; MEASURING SYSTEM; SURFACE CHARGE;

ELECTRIC INSULATORS;

EID: 33846871260     PISSN: 10090630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1009-0630/8/5/15     Document Type: Article

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