메뉴 건너뛰기




Volumn 5, Issue 4, 1998, Pages 497-504

Principle of surface charge measurement for thick insulating specimens

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC CHARGE MEASUREMENT; ELECTROSTATICS;

EID: 0032139974     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.708264     Document Type: Article
Times cited : (108)

References (7)
  • 1
    • 0030359310 scopus 로고    scopus 로고
    • Using the λ Function to Evaluate Probe Measurements of Charged Dielectric Surfaces
    • T. O. Rerup, G. C. Crichton and I. W. McAllister, "Using the λ Function to Evaluate Probe Measurements of Charged Dielectric Surfaces", IEEE Trans. Dielectrics EI, Vol. 3, pp. 770-777, 1996.
    • (1996) IEEE Trans. Dielectrics EI , vol.3 , pp. 770-777
    • Rerup, T.O.1    Crichton, G.C.2    McAllister, I.W.3
  • 3
    • 0001391579 scopus 로고
    • Oberflächenladungen bei rotationssymmetrischen Isolierstoffkörpern
    • H. Specht, "Oberflächenladungen bei rotationssymmetrischen Isolierstoffkörpern", ETZ-A, Vol. 97, p. 474, 1976.
    • (1976) ETZ-A , vol.97 , pp. 474
    • Specht, H.1
  • 4
    • 0001741448 scopus 로고
    • Measurement of Accumulated Charge on Dielectric Surfaces with an Electrostatic Probe
    • New York: Pergamon
    • M. Yashima, H. Fujinami and T. Takuma, "Measurement of Accumulated Charge on Dielectric Surfaces with an Electrostatic Probe", Gaseous Dielectrcs V, pp. 242-247, New York: Pergamon, 1987.
    • (1987) Gaseous Dielectrcs , vol.5 , pp. 242-247
    • Yashima, M.1    Fujinami, H.2    Takuma, T.3
  • 5
    • 0023845079 scopus 로고
    • Analytical Method for Evaluating Surface Charge Distribution on a Dielectric from Capacitive Probe Measurement-Application to a Cone-type Spacer in ±500 kV DC-GIS
    • H. Ootera and K. Nakanishi, "Analytical Method for Evaluating Surface Charge Distribution on a Dielectric from Capacitive Probe Measurement-Application to a Cone-type Spacer in ±500 kV DC-GIS", IEEE Trans. Power Del., Vol. 3, pp. 165-172, 1988.
    • (1988) IEEE Trans. Power Del. , vol.3 , pp. 165-172
    • Ootera, H.1    Nakanishi, K.2
  • 6
    • 2742606298 scopus 로고
    • Electric Field Computation from Probe Measurements of Charge on Spacers Subjected to Impulse Voltages
    • Braunschweig, Germany, paper 33.14
    • C. E. Sudhakar and K. D. Srivastava, "Electric Field Computation from Probe Measurements of Charge on Spacers Subjected to Impulse Voltages", 5th International Symposium on HV Engineering, Braunschweig, Germany, paper 33.14, 1987.
    • (1987) 5th International Symposium on HV Engineering
    • Sudhakar, C.E.1    Srivastava, K.D.2
  • 7
    • 0000445543 scopus 로고
    • On the Electrostatics of Probe Measurements of Surface Charge Densities
    • New York: Pergamon
    • A. Pedersen, "On the Electrostatics of Probe Measurements of Surface Charge Densities", Gaseous Dielectrics V, pp. 235-240, New York: Pergamon, 1987.
    • (1987) Gaseous Dielectrics , vol.5 , pp. 235-240
    • Pedersen, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.