Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle X-ray scattering

Langmuir

Volumn 23, Issue 2, 2007, Pages 353-356

  Kucheyev, Sergei O ^a   Toth, Milos ^b,c   Baumann, Theodore F ^a   Hamza, Alex V ^a   Ilavsky, Jan ^d   Knowles, W Ralph ^b   Saw, Cheng K ^a   Thiel, Bradley L ^c   Tileli, Vasiliki ^c   Van Buuren, Tony ^a   Wang, Y Morris ^a   Willey, Trevor M ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Thermo Fisher Scientific   (United States)

^c STATE UNIVERSITY OF NEW YORK   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOW-VACUUM ELECTRON MICROSCOPY; NANOPOROUS DIELECTRICS; SHAPE DISTRIBUTIONS;

AEROGELS; MICROCRACKS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; VACUUM; X RAY SCATTERING;

DIELECTRIC DEVICES;

EID: 33846870345     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0619729     Document Type: Article

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