Secondary electron emission of TiN-coated alumina ceramics

Vacuum

Volumn 81, Issue 6 SPEC. ISS., 2007, Pages 799-802

  Suharyanto, ^a,b   Michizono, Shinichiro ^c   Saito, Yoshio ^c   Yamano, Yasushi ^a   Kobayashi, Shinichi ^a  

^a SAITAMA UNIVERSITY   (Japan)

^b GADJAH MADA UNIVERSITY   (Indonesia)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Alumina; Anti multipactor; High temperature measurement; rf window; Secondary electron emission; TiN

Indexed keywords

ALUMINA; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SURFACE CHEMISTRY; THIN FILMS; TITANIUM NITRIDE;

ANTI-MULTIPACTORS; HIGH-TEMPERATURE MEASUREMENT; RF WINDOW; SECONDARY ELECTRON EMISSION; SURFACE HEATING;

CERAMIC MATERIALS;

EID: 33846828451     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.11.062     Document Type: Article

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