Measurements of secondary electron-emission coefficients and cathodoluminescence spectra for annealed alumina ceramics

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 324-328

  Sato, T ^a   Kobayashi, S ^a   Michizono, S ^b   Saito, Y ^b  

^a SAITAMA UNIVERSITY   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Alumina ceramics; Annealing; Cathodoluminescence; Secondary electron emission; X ray irradiation

Indexed keywords

ANNEALING; CATHODOLUMINESCENCE; DIELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; IRRADIATION; LIGHT ABSORPTION; OXYGEN; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; SURFACES; VACUUM; X RAYS;

ALUMINA CERAMICS; CATHODOLUMINESCENCE SPECTRA; DIELECTRIC BREAKDOWN STRENGTH; HIGH POWER VACUUM DEVICES; OXYGEN VACANCY; SECONDARY ELECTRON EMISSION COEFFICIENTS;

ALUMINA;

EID: 0032625043     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00819-8     Document Type: Article

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