Observation of antiphase domains in BiFeO3 thin films by X-ray diffraction

Physica B: Condensed Matter

Volumn 391, Issue 1, 2007, Pages 124-129

  Wan, Li ^a   Li, Yawei ^b   Meng, Xiangjian ^b   Sun, Jinglan ^b   Yuan, Xianzhang ^a   Shangguan, Jinsi ^a   Chu, Junhao ^b  

^a WENZHOU UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Annealing ambience; Antiphase domains; Ferroelectric materials; Perovskite

Indexed keywords

BISMUTH COMPOUNDS; FERROELECTRIC MATERIALS; FILM GROWTH; IRON OXIDES; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ANNEALING AMBIENCE; ANTIPHASE DOMAINS; FIRST ORDER DIFFRACTION; PLANAR DEFECTS;

THIN FILMS;

EID: 33846820441     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.09.007     Document Type: Article

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