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Volumn 429, Issue 1-2, 2007, Pages 143-155
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Characterization of interdiffusion growth of aluminized layer on Ti alloys
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Author keywords
Intermetallics; Phase transitions; Scanning electron microscopy, SEM; Thin films; X ray diffraction
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Indexed keywords
ALUMINUM;
ANNEALING;
COMPOSITION;
INTERDIFFUSION (SOLIDS);
INTERMETALLICS;
MICROSTRUCTURE;
PHASE TRANSITIONS;
RECRYSTALLIZATION (METALLURGY);
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
ALUMINIDE PHASES;
INITIAL SUBSTRATE;
OVERLAYERS;
TITANIUM ALLOYS;
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EID: 33846795980
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2006.04.017 Document Type: Article |
Times cited : (4)
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References (13)
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