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Volumn 429, Issue 1-2, 2007, Pages 143-155

Characterization of interdiffusion growth of aluminized layer on Ti alloys

Author keywords

Intermetallics; Phase transitions; Scanning electron microscopy, SEM; Thin films; X ray diffraction

Indexed keywords

ALUMINUM; ANNEALING; COMPOSITION; INTERDIFFUSION (SOLIDS); INTERMETALLICS; MICROSTRUCTURE; PHASE TRANSITIONS; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

EID: 33846795980     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.04.017     Document Type: Article
Times cited : (4)

References (13)
  • 1
    • 0002333778 scopus 로고
    • Kim Y.-W., Wagner R., and Yamaguchi M. (Eds), TMS, Warrendale, PA
    • Dimiduk D.M. In: Kim Y.-W., Wagner R., and Yamaguchi M. (Eds). Gamma Titanium Aluminides (1995), TMS, Warrendale, PA 3
    • (1995) Gamma Titanium Aluminides , pp. 3
    • Dimiduk, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.