Ion beam modification and analysis of organometallics dispersed polymer films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 244, Issue 1, 2006, Pages 235-238

  Qureshi, Anjum ^a   Singh, N L ^a   Rakshit, A K ^a   Singh, F ^b   Ganesan, V ^c  

^a M S UNIVERSITY OF BARODA   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

AFM; Electrical properties; Ferric oxalate; Ion irradiation; Microhardness; Polymethyl methacrylate

Indexed keywords

AFM; ELECTRICAL PROPERTIES; FERRIC OXALATE; ION IRRADIATION;

ATOMIC FORCE MICROSCOPY; CONCENTRATION (PROCESS); ELECTRIC CONDUCTIVITY; ION BEAMS; MICROHARDNESS; ORGANOMETALLICS; POLYMETHYL METHACRYLATES;

PLASTIC FILMS;

EID: 33846783739     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.127     Document Type: Conference Paper

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