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Volumn 2005, Issue , 2005, Pages 61-68
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High quality uniform random number generation through LUT optimised linear recurrences
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYPTOGRAPHIC TESTS;
OPTIMISED LINEAR RECURRENCES;
STATISTICAL QUALITY;
TAUSWORTHE GENERATORS;
CRYPTOGRAPHICS;
EMPIRICAL TEST;
HIGH QUALITY;
LINEAR RECURRENCES;
MATRIX;
RANDOM BITS;
RANDOM NUMBER GENERATORS;
RANDOM-NUMBER GENERATION;
SAMPLE RATE;
COMPUTER ARCHITECTURE;
CRYPTOGRAPHY;
MATRIX ALGEBRA;
OPTIMIZATION;
RANDOM NUMBER GENERATION;
STATISTICAL METHODS;
TABLE LOOKUP;
FLIP FLOP CIRCUITS;
NUMBER THEORY;
FIELD PROGRAMMABLE GATE ARRAYS;
TABLE LOOKUP;
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EID: 33846630897
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/FPT.2005.1568526 Document Type: Conference Paper |
Times cited : (14)
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References (16)
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