Counting and integrating readout for direct conversion X-ray imaging concept, realization and first prototype measurements

IEEE Nuclear Science Symposium Conference Record

Volumn 5, Issue , 2005, Pages 2761-2765

  Kraft, Edgar ^a   Fischer, Peter ^a,b   Karagounis, Michael ^a   Koch, Manuel ^a   Krüger, Hans ^a   Peric, Ivan ^a,b   Wermes, Norbert ^a   Herrmann, Christoph ^c   Nascetti, Augusto ^c,d   Overdick, Michael ^c   Rütten, Walter ^c  

^a UNIVERSITY OF BONN   (Germany)

^b UNIVERSITY OF MANNHEIM   (Germany)

^c PHILIPS RESEARCH LABORATORIES   (Germany)

^d SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

Charge integration; Direct conversion; Pixelated semiconductor sensors; Read out electronics; Single photon counting; X ray imaging

Indexed keywords

CHARGE INTEGRATION; DIRECT CONVERSION; PIXELATED SEMICONDUCTOR SENSORS; READ OUT ELECTRONICS; SINGLE PHOTON COUNTING; X RAY IMAGING;

COMPUTERIZED TOMOGRAPHY; IMAGE SENSORS; MEDICAL APPLICATIONS; READOUT SYSTEMS; SIGNAL PROCESSING; X RAYS;

IMAGING SYSTEMS;

EID: 33846611106     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NSSMIC.2005.1596908     Document Type: Conference Paper

References (5)

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