Thin film patterning by surface-plasmon-induced thermocapillarity

Applied Physics Letters

Volumn 90, Issue 4, 2007, Pages

  Röntzsch, Lars ^a   Heinig, Karl Heinz ^a   Schuller, Jon A ^b   Brongersma, Mark L ^b  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DAMPING; MASS TRANSFER; POLYMETHYL METHACRYLATES; SURFACE PLASMON RESONANCE; THERMAL EFFECTS; THIN FILMS;

HILLOCK ARRAYS; SURFACE PLASMON POLARITON (SPP); THERMOCAPILLARITY; THIN POLYMETHYL METHACRYLATE (PMMA) FILMS;

CAPILLARITY;

EID: 33846573384     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2432282     Document Type: Article

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