Loading and characterization of a printed-circuit-board atomic ion trap

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 75, Issue 1, 2007, Pages

  Brown, Kenneth R ^a   Clark, Robert J ^a   Labaziewicz, Jaroslaw ^a   Richerme, Philip ^a   Leibrandt, David R ^a   Chuang, Isaac L ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD MEASUREMENT; ELECTRIC POTENTIAL; ELECTRON TRAPS; FREQUENCY METERS; LOADING;

ADDITIONAL VOLTAGES; SECULAR FREQUENCIES; SURFACE ELECTRODE ION TRAP;

PRINTED CIRCUIT BOARDS;

EID: 33846538685     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.75.015401     Document Type: Article

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