Low work-function cathodes from Schottky to field-induced ballistic electron emission: Self-consistent numerical approach

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 4, 2007, Pages

  Semet, V ^a   Adessi, Ch ^a   Capron, T ^a   Mouton, R ^a   Thien Binh, Vu ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846483234     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.045430     Document Type: Article

References (21)

1. A. van der Ziel, in Solid State Physical Electronics, edited by, W. L. Everitt, (Prentice-Hall Electrical Engineering Series, Prentice-Hall Inc., NJ, USA, 1957).
2. C. Herring and M. H. Nichols, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.21.185 21, 185 (1949).
3. R. H. Fowler and L. W. Nordheim, Proc. R. Soc. London PRLAAZ 0962-8444 10.1098/rspa.1928.0091 A119, 173 (1928).
4. E. L. Murphy and R. H. Good, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.102.1464 102, 1464 (1956).
5. R. G. Forbes, Ultramicroscopy ULTRD6 0304-3991 10.1016/S0304-3991(99) 00097-2 79, 11 (1999).
6. F. J. Himpsel, J. A. Knapp, J. A. Van Vechten, and D. E. Eastman, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.20.624 20, 624 (1979).
7. Vu Thien Binh and Ch. Adessi, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.85.864 85, 864 (2000).
8. V. Semet, Vu Thien Binh, J. P. Zhang, J. Yang, M. Azif Khan, and R. Tsu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1682701 84, 1937 (2004).
9. R. Z. Wang, X. M. Ding, B. Wang, K. Xue, J. B. Xu, H. Yan, and X. Y. Hou, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.125310 72, 125310 (2005).
10. V. Semet, M. Cahay, Vu Thien Binh, S. Fairchild, X. Wu, and D. J. Lockwood, J. Vac. Sci. Technol. B JVTBD9 0734-211X 10.1116/1.2354161 24 (5), 2412 (2006).
11. Some preliminary results have been presented in the Joint meeting 19th Int. Vacuum Nanoelectronics. Conf. and 50th Int. Field Emission Symp. in Guilin, China, July 2006.
12. A. Mayer and J. P. Vigneron, J. Vac. Sci. Technol. B JVTBD9 0734-211X 10.1116/1.590586 17, 506 (1999);
13. A. Mayer and J. P. Vigneron, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.16138 62, 16138 (2000).
14. K. L. Jensen, in Vacuum Microelectronics, edited by, Wei Zhu, (Wiley, New York, 2001), Chap..
15. T. C. Choy, A. H. Harker, and A. M. Stoneham, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/16/6/015 16, 861 (2004).
16. R. Forbes, Surf. Interface Anal. SIANDQ 0142-2421 36, 395 (2004).
17. K. L. Jensen and M. Cahay, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2193776 88, 154105 (2006).
18. C. Adessi and M. Devel, Phys. Rev. A PLRAAN 1050-2947 10.1103/PhysRevA.60.2194 60, 2194 (1999);
19. C. Adessi and M. Devel, Ultramicroscopy ULTRD6 0304-3991 85, 215 (2000).
20. B. Lippmann and J. Schwinger, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.79.469 79, 469 (1950).
21. N. D. Lang and A. R. Williams, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.18.616 18, 616 (1978).