Thickness effects on photoinduced current in ferroelectric (Pb0.97 La0.03) (Zr0.52 Ti0.48) O3 thin films

Journal of Applied Physics

Volumn 101, Issue 1, 2007, Pages

  Qin, Meng ^a,b   Yao, Kui ^a   Liang, Yung C ^b   Shannigrahi, Santiranjan ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; LIGHTING; NANOSTRUCTURED MATERIALS; PHOTOCURRENTS; POLARIZATION; THICKNESS MEASUREMENT; ULTRAVIOLET RADIATION;

FILM THICKNESS DEPENDENCE; PHOTOINDUCED CURRENTS; THICKNESS DEPENDENT PHOTOCURRENT; THICKNESS EFFECTS;

FERROELECTRIC THIN FILMS;

EID: 33846310785     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2405732     Document Type: Article

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