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Volumn 40, Issue 5, 2007, Pages 1486-1497

Rectified nearest feature line segment for pattern classification

Author keywords

Distribution concentration; Interpolation and extrapolation accuracy; Nearest feature line; Pattern classification; Rectified nearest feature line segment

Indexed keywords

DATA STRUCTURES; EXTRAPOLATION; INTERPOLATION; PATTERN RECOGNITION;

EID: 33846293569     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2006.10.021     Document Type: Article
Times cited : (38)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.