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Volumn 15, Issue 2, 2000, Pages 759-762
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A theoretical justification of nearest feature line method
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Author keywords
[No Author keywords available]
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Indexed keywords
ERRORS;
ERROR RATE;
FEATURE SPACE;
NEAREST FEATURE LINE METHOD;
NEAREST FEATURE LINES;
NEAREST NEIGHBOR CLASSIFIER;
REAL APPLICATIONS;
PATTERN RECOGNITION;
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EID: 3042533328
PISSN: 10514651
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (7)
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References (7)
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