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Volumn 2005, Issue , 2005, Pages 165-174
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Design pattern detection in eiffel systems
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATION;
COMPUTER SOFTWARE;
PATTERN MATCHING;
REVERSE ENGINEERING;
SYSTEMS ANALYSIS;
DESIGN PATTERN VERIFICATION TOOLKIT (DPVK);
EIFFEL SYSTEMS;
SOFTWARE SYSTEMS;
STATIC STRUCTURE;
SOFTWARE ENGINEERING;
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EID: 33846261231
PISSN: 10951350
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/WCRE.2005.14 Document Type: Conference Paper |
Times cited : (13)
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References (12)
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