The UltraSPARC T1 processor: CMT reliability

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2006, Pages 555-562

  Leon, Ana Sonia ^a,b   Langley, Brian ^a,b   Shin, Jinuk Luke ^a,b  

^a IEEE

^b SUN MICROSYSTEMS   (United States)

Author keywords

Channel Hot Carrier (CHC); Chip MultiThreading (CMT); Electromigration (EM); Error Correcting Code (ECC); Gate Oxide Integrity (GOI); Negative Bias Temperature Instability (NBTI); Niagara processor; Reliability, Availability, and Serviceability (RAS)

Indexed keywords

CHANNEL HOT CARRIER (CHC); CHIP MULTITHREADING (CMT); ERROR CORRECTING CODE (ECC);

BANDWIDTH; CMOS INTEGRATED CIRCUITS; FEATURE EXTRACTION; INTERFACES (COMPUTER); ROBUSTNESS (CONTROL SYSTEMS);

PROGRAM PROCESSORS;

EID: 33846258518     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320989     Document Type: Conference Paper

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