Schottky contact analysis of photovoltaic chalcopyrite thin film absorbers

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 362, Issue 2-3, 2007, Pages 229-233

  Schlenker, E ^a   Mertens, V ^a   Parisi, J ^a   Reineke Koch, R ^b   Kontges M ^b  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

Capacitance measurements; Cu(In, Ga)Se2; Schottky contacts

Indexed keywords

CAPACITANCE; CAPACITANCE MEASUREMENT; COPPER COMPOUNDS; ETCHING; THIN FILM DEVICES;

CAPACITANCE VOLTAGE MEASUREMENTS; CHALCOPYRITE THIN FILMS; CU(IN , GA)SE2; DIELECTRIC LAYER; METHANOL SOLUTION; PHOTOVOLTAIC THIN FILMS; SCHOTTKY CONTACTS; SEMI-CONDUCTOR SURFACES;

THIN FILMS;

EID: 33846255452     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2006.10.039     Document Type: Article

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