Time-resolved thermal characterization of semiconductor lasers

Applied Physics Letters

Volumn 90, Issue 2, 2007, Pages

  Lanco, L ^a   Ducci, S ^a   Likforman, J P ^a   Filloux, P ^a   Marcadet, X ^b   Calligaro, M ^b   Leo, G ^a   Berger, V ^a  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b ALCATEL THALES III V LAB   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FABRY-PEROT INTERFEROMETERS; HEATING; LIGHT MEASUREMENT; NONDESTRUCTIVE EXAMINATION; NONLINEAR SYSTEMS; PROBES; THERMODYNAMIC PROPERTIES;

CAVITY TEMPERATURE; FABRY-PEROT OSCILLATIONS; TIME RESOLVED CHARACTERIZATION;

SEMICONDUCTOR LASERS;

EID: 33846195826     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2430776     Document Type: Article

References (11)

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