Trace element determination using static high-sensitivity inductively coupled plasma optical emission spectrometry (SHIP-OES)

Analytica Chimica Acta

Volumn 583, Issue 2, 2007, Pages 319-325

  Engelhard, Carsten ^a   Scheffer, Andy ^a   Nowak, Sascha ^a   Vielhaber, Torsten ^a   Buscher, Wolfgang ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Certified reference material; Inductively coupled plasma; Low flow torch; Optical emission spectrometry; Static high sensitivity ICP; Trace element determination

Indexed keywords

ARGON; INDUCTIVELY COUPLED PLASMA; NATURAL FREQUENCIES; OPTIMIZATION; REACTION KINETICS; SPECTROMETRY;

CERTIFIED REFERENCE MATERIAL; LOW-FLOW TORCH; OPTICAL EMISSION SPECTROMETRY; STATIC HIGH-SENSITIVITY ICP; TRACE ELEMENT DETERMINATION;

TRACE ELEMENTS;

ARGON; CHROMIUM; COBALT; COPPER; MAGNESIUM; MANGANESE; TRACE ELEMENT; ZINC;

ACCURACY; ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; CHEMICAL ANALYSIS; COOLING; EVALUATION; EXCITATION; FLAME PHOTOMETRY; GAS FLOW; INTERMETHOD COMPARISON; NEBULIZATION; PRIORITY JOURNAL; PROCESS OPTIMIZATION; RADIOFREQUENCY; RYE; STATIC HIGH SENSITIVITY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY;

CHEMISTRY, ANALYTICAL; OPTICS; TRACE ELEMENTS;

SECALE CEREALE;

EID: 33846181958     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2006.10.014     Document Type: Article

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