Adaptive random testing by bisection with restriction

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3785 LNCS, Issue , 2005, Pages 251-263

  Mayer, Johannes ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ERROR DETECTION; FAILURE ANALYSIS; PATTERN RECOGNITION; RANDOM PROCESSES; TEST FACILITIES;

ADAPTIVE RANDOM TESTING (ART); BISECTION; COMPUTATIONAL EFFICIENCY; TEST CASES;

ADAPTIVE ALGORITHMS;

EID: 33646766133     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11576280_18     Document Type: Conference Paper

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