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Volumn 39, Issue 23, 2006, Pages 5013-5022

Stark broadening measurements of Xe III spectral lines

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ELECTRON DENSITY MEASUREMENT; IONIZATION; PLASMA SOURCES; TEMPERATURE MEASUREMENT;

EID: 33846089860     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/39/23/017     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.