A new method for identification of RTS noise

Bulletin of the Polish Academy of Sciences: Technical Sciences

Volumn 54, Issue 4, 2006, Pages 457-460

  Konczakowska, A ^a   Cichosz, J ^a   Szewczyk, A ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Noise scattering pattern method; RTS noise identification

Indexed keywords

COMPUTATIONAL METHODS; PATTERN RECOGNITION; RADIO TELEGRAPH;

NOISE IDENTIFICATION; NOISE SCATTERING PATTERN METHOD; NOISE SIGNAL;

SPURIOUS SIGNAL NOISE;

EID: 33845992943     PISSN: 02397528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. J. Cichosz, A. Szewczyk, and A. Konczakowska, "The virtual instrument for RTS noise detection in semiconductor devices by Noise Scattering Pattern method", Proc. IV State Conference on Electronics KKE'2005, (2005), (in Polish).
2. J. Cichosz and A. Szatkowski, "The method for burst noise detection, particularly in semiconductor devices", Patent Application P-375610, Polish Patent Office, 2005, (in Polish).
3. th Inter. Conf. on Noise and Fluctuations - ICNF 2005, Salamanca, Spain, 673-676 (2005).