Analytic treatment of charge cloud overlaps: An improvement of the tomographic atom probe efficiency

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 442-448

  Bas, P ^a   Bostel, A ^a   Grancher, G ^a   Deconihout, B ^a   Blavette, D ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CALCULATIONS; CHARGE TRANSFER; CHARGED PARTICLES; COPPER ALLOYS; DETECTORS; EFFICIENCY; IONS; PROBES;

CHARGE CENTROIDING; CHARGE CLOUDS; CLOSE SPACED POSITIONS; CORRECTION METHOD; GAUSSIAN LAW; MASS TO CHARGE RATIO; PLANE BY PLANE ANALYSIS; TOMOGRAPHIC ATOM PROBE;

OPTICAL INSTRUMENTS;

EID: 16144369037     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00408-4     Document Type: Article

References (10)

1. D. Blavette, B. Deconihout, A. Bostel, J.M. Sarrau, M. Bouet and A. Menand, Rev. Sci. Instr. 64 (1993) 2911.
2. B. Deconihout, A. Bostel, M. Bouet, J.M. Sarrau, P. Bas and D. Blavette, Appl. Surf. Sci. 87/88 (1995) 428.
3. B. Deconihout, A. Bostel, P. Bas, S. Chambreland, L. Letellier, F. Danoix and D. Blavette, Appl. Surf. Sci. 76/77 (1994) 145.
4. B. Deconihout, Thèse de Doctorat, Rouen (1993).
5. S. Duval, S. Chambreland and B. Deconihout, Appl. Surf. Sci. 94/95 (1996) 449.
6. D. Kelker, Sankhya A 32 (1970) 419.
7. A.S. Cooper, A. Cerezo, J.M. Hyde, R.A.D. Mackenzie and G.D.W. Smith, Appl. Surf. Sci. 76/77 (1994) 409.
8. M.L. Edgar, R. Kessel, J.S. Lapington and D.M. Walton, Rev. Sci. Instr. 60 (1989) 3673.
9. L. Lebart, A. Morineau and J.P. Fénelon, Traitement des données statistiques (Dunod, Paris, 1979) pp. 18-33.
10. A.R. Waugh, E.D. Boyes and J.M. Southon, Surf. Sci. 61 (1976) 109.