Measurement of spin diffusion length in sputtered Ni films using a special exchange-biased spin valve geometry

Applied Physics Letters

Volumn 90, Issue 1, 2007, Pages

  Moreau, Charles E ^a   Moraru, Ion C ^b   Birge, Norman O ^b   Pratt Jr , William P ^b  

^a ALBION COLLEGE   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPIN DIFFUSION; SPIN VALVE GEOMETRY; VALET-FERT THEORY;

DIFFUSION; MAGNETRON SPUTTERING; MATHEMATICAL MODELS; NICKEL; SCATTERING PARAMETERS;

MAGNETIC FILMS;

EID: 33846058957     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2424437     Document Type: Article

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