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Volumn 56, Issue 11, 2006, Pages 1518-1524

Emission factors of air toxics from semiconductor manufacturing in Korea

Author keywords

[No Author keywords available]

Indexed keywords

AIR POLLUTION; AIR POLLUTION CONTROL; AIR QUALITY; HAZARDOUS MATERIALS; HEAVY METALS; PARTICULATE EMISSIONS;

EID: 33846043545     PISSN: 10962247     EISSN: 21622906     Source Type: Journal    
DOI: 10.1080/10473289.2006.10464556     Document Type: Article
Times cited : (20)

References (16)
  • 1
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    • Stationary Point and Area Sources, Ed. 5, AP-42; U.S. Environmental Protection Agency, Office of Air Quality Planning and Standards: Research Triangle Park, NC
    • Gartner Dataquest: Compilation of Air Pollutant Emission Factors Volume 1; Stationary Point and Area Sources, Ed. 5, AP-42; U.S. Environmental Protection Agency, Office of Air Quality Planning and Standards: Research Triangle Park, NC, 2003.
    • (2003) Compilation of Air Pollutant Emission Factors Volume 1
  • 2
    • 33846084213 scopus 로고    scopus 로고
    • National Institute of Environmental Research, Ministry of Environment: Incheon, Korea
    • Gartner Dataquest: Compilation of Air Pollutant Emission Factors in Stationary Sources; National Institute of Environmental Research, Ministry of Environment: Incheon, Korea, 2003.
    • (2003) Compilation of Air Pollutant Emission Factors in Stationary Sources
  • 3
    • 85011212721 scopus 로고    scopus 로고
    • Gartner Dataquest: Stamford, CT
    • Gartner Dataquest: Gartner Dataquest Market Databook; Gartner Dataquest: Stamford, CT, 2002.
    • (2002) Gartner Dataquest Market Databook
  • 5
    • 33846118283 scopus 로고    scopus 로고
    • Chapter 3; National Institute of Environmental Research, Ministry of Environment: Incheon, Korea
    • EIIP. Standard Testing Method for Air Pollution, Chapter 3; National Institute of Environmental Research, Ministry of Environment: Incheon, Korea, 1999.
    • (1999) Standard Testing Method for Air Pollution
  • 6
    • 33846118768 scopus 로고
    • Office of the Federal Register National Archives and Records Administration, U.S. Government Printing Office: Washington, DC
    • U.S. Environmental Protection Agency. Code of Federal Regulations 40 Part 60 Appendix A; Office of the Federal Register National Archives and Records Administration, U.S. Government Printing Office: Washington, DC, 1995.
    • (1995) Code of Federal Regulations 40 Part 60 Appendix A
  • 8
    • 19444370432 scopus 로고    scopus 로고
    • Office of Air Quality Planning and Standards, Office of Air and Radiation, U.S. Environmental Protection Agency: Research Triangle Park, NC
    • U.S. Environmental Protection Agency. Procedures for Preparing Emission Factor Documents; Office of Air Quality Planning and Standards, Office of Air and Radiation, U.S. Environmental Protection Agency: Research Triangle Park, NC, 1997.
    • (1997) Procedures for Preparing Emission Factor Documents
  • 10
    • 85011240253 scopus 로고    scopus 로고
    • RIN 2060-AG 93
    • 40 CFR Part 63
    • National Emission Standards for Hazardous Air Pollutants for Semiconductor Manufacturing; 40 CFR Part 63; RIN 2060-AG 93. Fed. Regist. 2003, 68, 99.
    • (2003) Fed. Regist. , vol.68 , pp. 99
  • 12
    • 85011212734 scopus 로고    scopus 로고
    • accessed
    • U.S. Environmental Protection Agency. Air Toxics web site; available at http://www.epa.gov/ttn/atw/ (accessed 2003).
    • (2003) Air Toxics Web Site
  • 13
    • 0003447995 scopus 로고    scopus 로고
    • 2nd ed.; Index to Methodology Chapters Ordered by Snap 97 Activity; Copenhagen, Denmark
    • EEA, Atmospheric EmissionInventory Guidebook, 2nd ed.; Index to Methodology Chapters Ordered by Snap 97 Activity; Copenhagen, Denmark, 1999.
    • (1999) Atmospheric Emissioninventory Guidebook
  • 14
    • 0042628755 scopus 로고    scopus 로고
    • accessed
    • ETC/AE. CORINAIR 1994 Inventory; available at http://www.aeat.co.uk/netcen/corinair/94 (accessed 1998).
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  • 15
    • 0042123761 scopus 로고    scopus 로고
    • Emission Characteristics of Volatile Organic Compounds from Semiconductor Manufacturing
    • Chein, H.M.; Chen, T.M. Emission Characteristics of Volatile Organic Compounds from Semiconductor Manufacturing; J. Air & Waste Manage. Assoc. 2003, 53, 1029-1036.
    • (2003) J. Air & Waste Manage. Assoc , vol.53 , pp. 1029-1036
    • Chein, H.M.1    Chen, T.M.2
  • 16
    • 0346816625 scopus 로고    scopus 로고
    • Emission Characteristics and Control Efficiency of Acidic and Basic Gases and Aerosols from Packed Towers
    • Tasi, C.J.; Chang, C.T.; Liu, T.W.; Huang, C.C.; Chien, C.L.; Chein, H.M. Emission Characteristics and Control Efficiency of Acidic and Basic Gases and Aerosols from Packed Towers; Atmos. Environ. 2003, 38, 643-646.
    • (2003) Atmos. Environ , vol.38 , pp. 643-646
    • Tasi, C.J.1    Chang, C.T.2    Liu, T.W.3    Huang, C.C.4    Chien, C.L.5    Chein, H.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.