Modelling and refining site-specific radiation damage in SAD/MAD phasing

Journal of Synchrotron Radiation

Volumn 14, Issue 1, 2007, Pages 34-42

  Schiltz, M ^a   Bricogne, G ^b  

^a EPFL   (Switzerland)

^b GLOBAL PHASING LTD   (United Kingdom)

Author keywords

Heavy atom refinement; MAD phasing; Radiation damage

Indexed keywords

DOSIMETRY; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; IRRADIATION; MATHEMATICAL MODELS;

HARKER CONSTRUCTION; HEAVY ATOM REFINEMENT; PHASING POWER; SYMMETRY RELATED REFLECTIONS;

RADIATION DAMAGE;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; MACROMOLECULE; METHODOLOGY; PROTEIN DENATURATION; RADIATION DOSE; RADIATION EXPOSURE; RADIATION RESPONSE; X RAY; X RAY CRYSTALLOGRAPHY;

COMPUTER SIMULATION; CRYSTALLOGRAPHY, X-RAY; DOSE-RESPONSE RELATIONSHIP, RADIATION; MACROMOLECULAR SUBSTANCES; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; PROTEIN DENATURATION; RADIATION DOSAGE; X-RAYS;

EID: 33846042732     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049506038970     Document Type: Conference Paper

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