Verifying DiffEXAFS measurements with differential X-ray diffraction

Journal of Synchrotron Radiation

Volumn 14, Issue 1, 2007, Pages 169-172

  Ruffoni, M P ^a   Pettifer, R F ^a   Pascarelli, S ^b   Mathon, O ^b  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Atomic strain; DiffEXAFS; DiffXRD; Strontium fluoride; Thermal expansion

Indexed keywords

MEASUREMENT THEORY; PERTURBATION TECHNIQUES; STRONTIUM COMPOUNDS; THERMAL EXPANSION; X RAY DIFFRACTION;

ATOMIC PERTURBATIONS; ATOMIC STRAIN; STRONTIUM FLUORIDE; THERMAL EXPANSION COEFFICIENTS;

X RAY SPECTROSCOPY;

ARTICLE; EVALUATION; METHODOLOGY; RADIATION SCATTERING; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; VALIDATION STUDY; X RAY DIFFRACTION;

REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; X-RAY DIFFRACTION;

EID: 33846040824     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049506049971     Document Type: Conference Paper

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