Process capability evaluation for the process of product families

Quality and Quantity

Volumn 41, Issue 1, 2007, Pages 151-162

  Chen, K S ^a   Huang, M L ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Process capability index; Process yield; Product family

Indexed keywords

EID: 33845964500     PISSN: 00335177     EISSN: 15737845     Source Type: Journal    
DOI: 10.1007/s11135-005-6223-7     Document Type: Article

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