Structural, electrical and magnetic properties of evaporated Ni/Cu and Ni/glass thin films

Materials Science and Engineering: B

Volumn 136, Issue 2-3, 2007, Pages 197-202

  Nacereddine, C ^a   Layadi, A ^a   Guittoum, A ^b   Cherif S M ^c   Chauveau, T ^c   Billet, D ^c   Youssef, J Ben ^d   Bourzami, A ^a   Bourahli, M H ^a  

^a FERHAT ABBAS UNIVERSITY   (Algeria)

^b CENTRE DE RECHERCHE NUCLÉAIRE D ALGER   (Algeria)

^c UNIVERSITÉ PARIS 13   (France)

^d UNIVERSITÉ DE BRETAGNE OCCIDENTALE   (France)

Author keywords

Electrical properties; Magnetization curves; Ni thin films; Structure

Indexed keywords

COPPER; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; GLASS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIC PROPERTIES; MAGNETIZATION; NICKEL; NUCLEATION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MAGNETIZATION CURVES; NICKEL (NI) THIN FILMS; SATURATION FIELDS; VIBRATING SAMPLE MAGNETOMETER (VSM);

THIN FILMS;

EID: 33845916321     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.09.021     Document Type: Article

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