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Volumn 2005, Issue , 2005, Pages 135-138
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A highly efficient statistical compact model parameter extraction scheme
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA ACQUISITION;
OPTIMIZATION;
STATISTICAL METHODS;
TRANSISTORS;
COMPACT MODELS;
DEVICE CHARACTERISTICS;
PARAMETER EXTRACTION SCHEMES;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 33845879070
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/sispad.2005.201491 Document Type: Conference Paper |
Times cited : (5)
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References (6)
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