Magnetic and chemical properties of Co2MnSi thin films compared to the Co2MnSi/Al-O interface

Journal of Applied Physics

Volumn 100, Issue 11, 2006, Pages

  Schmalhorst, J ^a   Sacher, M D ^a   Hoink V ^a   Reiss, G ^a   Hutten A ^b   Engel, D ^c   Ehresmann, A ^c  

^a BIELEFELD UNIVERSITY   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COBALT COMPOUNDS; INTERFACES (MATERIALS); MAGNETISM; MANGANESE COMPOUNDS; OPTICAL PROPERTIES;

CHEMICAL PROPERTIES; CIRCULAR DICHROISM; MAGNETIC TUNNEL JUNCTIONS; SPIN POLARIZATION; VANADIUM BUFFER;

THIN FILMS;

EID: 33845800458     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2384806     Document Type: Article

References (20)

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