Thin film of copper hexacyanoferrate dispersed on the surface of a conducting carbon ceramic material, SiO2/ZrO2/C-graphite: Characteristics and electrochemical studies

Journal of the Brazilian Chemical Society

Volumn 17, Issue 8, 2006, Pages 1605-1611

  Marafon, Eduardo ^a   Lucho, Alzira M S ^a   Francisco, Maria S P ^a   Landers, Richard ^a,b   Gushikem, Yoshitaka ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

Carbon ceramic material; Conducting ceramic material; Copper hexacyanoferrate film; Silica zirconia graphite

Indexed keywords

EID: 33845799105     PISSN: 01035053     EISSN: 16784790     Source Type: Journal    
DOI: 10.1590/S0103-50532006000800018     Document Type: Conference Paper

References (39)

1. Tacconi, N. R.; Rajeshwar, K.; Lezna, R. O.; Chem. Mater. 2003, 15, 3046.
2. Mattos, I. L.; Gorton, L.; Laurel, T.; Malinauskas, A.; Karyakin, A. A.; Talanta 2000, 52, 791.
3. Narayanan, S. S.; Scholz, F.; Electroanalysis 1999, 11, 465.
4. Loos-Neskovic, C.; Ayrault, S.; Badillo, V.; Jimenez, B.; Garnier, E.; Fedoroff, M.; Jones, D. J.; Merinov, B.; J. Solid State Chem. 2004, 177, 1817.
5. Chen, Shen-Ming; Chan, Chia-Ming; J. Electroanal. Chem. 2003, 543, 161.
6. Cui, X.; Hong, L.; Lin, X.; J. Electroanal., Chem. 2002, 526, 115.
7. Siperko, L. M.; Kuwana, T.; J. Electrochem. Soc. 1983, 130, 396.
8. Zaldivar, G. A. P.; Gushikem, Y.; Kubota, L. T.; J. Electroanal. Chem. 1991, 318, 241
9. Zaldivar, G. A. P.; Gushikem, Y.; J. Electroanal. Chem. 1992, 337, 165.
10. Kubota, L.; Gushikem, Y.; J. Electroanal. Chem. 1993, 362, 219.
11. Cunha, L. J. V.; Andreotti, E. I. S.; Gushikem, Y.; J. Braz. Chem. Soc. 1995, 6, 271.
12. Tsionsky, M.; Gun, G.; Glezer, V.; Lev, O.; Anal. Chem. 1994, 66, 1747.
13. Lev, O.; Wu, Z.; Bharati, S.; Glezer, V.; Modestov, A.; Gun, J.; Rabinovich, L.; Sampath. S.; Chem. Mater. 1997, 9, 2354.
14. Rabinovich, L.; Gun, J.; Lev, O.; Aurbach, D.; Markosvky, B.; Levi, M. C.; Adv. Mater. 1998, 10, 577.
15. Rabinovich, L.; Lev, O.; Electroanalysis 2001, 13, 265.
16. Salimi, A.; Poubeyram, S.; Talanta 2003, 60, 205.
17. Shul, G.; Sackek-Maj, M.; Opallo, M.; Electroanlysis 2004, 16, 1254.
18. Salimi, A.; Abdi, K.; Talanta 2004, 63, 475.
19. Salimi, A.; Abdi, K.; Khayatian, G.; Electrochim. Acta 2004, 49, 413.
20. Rozniecka, E.; Shul, G.; Sirieix-Plenet, J.; Guillon, L.; Opallo, M.; Electrochem. Commun. 2005, 7, 299.
21. Shul, G.; Opallo, M.; Marken, F.; Electrochim. Acta 2005, 50, 2315.
22. Salimi, A.; Nasiri, S.; Hadad, H.; Mohebi, S.; Electroanalysis 2005, 17, 2273.
23. Zaitseva, G.; Gushikem, Y.; J. Braz. Chem. Soc. 2002, 13, 611.
24. Alfaya, A. A. S.; Gushikem, Y.; Castro, S. C.; Chem. Mater. 1998, 10, 909.
25. Kurihara, L. A.; Fujiwara, S. T.; Alfaya, R. V. S.; Gushikem,Y.; Alfaya, A. A. S.; Castro, S. C.; J. Colloid Interface Sci. 2004, 274, 579.
26. Marafon, E.; Francisco, M. S. P.; Lucho, A. M. S.; Landers, R.; Gushikem, Y.; Br PI 0506395-7, 2005.
27. http://www.astm.org, number F43-99, accessed in June 2005.
28. Parks, G.A.; Chem. Rev. 1965, 65, 111.
29. Ryczkowki, J.; Catal. Today 2001, 68, 263.
30. Scofield, J. H.; J. Electron Spectrosc. 1976, 89, 129.
31. JCPDS - International Centre for Diffraction Data. PCPDFWIN version 1.30, 1997.
32. Pauliukaite, R.; Florescu, M.; Brett, C. M. A.; J. Solid State Electrochem. 2005, 9, 354.
33. Cardoso,W. S.; Francisco, M. S. P.; Lucho,A. M. S.; Gushikem, Y.; Solid State Ionics 2004, 167, 165.
34. Moulder, J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D.; Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corporation/Physical Electronics Divison: Eden Prairie, 1992.
35. Barr, T. L.; J. Phys. Chem. 1978, 82, 1801.
36. Makowski, O.; Stroka, J.; Kulesza, P. J.; Malik,M. A.; Galus, Z.; J. Electroanal. Chem. 2002, 532, 157.
37. Kahlert, H.; Retter, U.; Lohse, H.; Siegler, K.; Scholz, F.; J. Phys. Chem. B 1998, 102, 8757.
38. Bharathi, S.; Nogami, M.; Ikeda, S.; Langmuir 2001, 17, 7468.
39. Juttner, K.; Electrochim. Acta 1990, 35, 1501.