Imaging colloidal particle induced topological defects in a nematic liquid crystal using third harmonic generation microscopy

Optics Express

Volumn 14, Issue 26, 2006, Pages 12976-12983

  Pillai, Rajesh S ^a   Oh E, Masahito ^b   Yokoyama, Hiroshi ^b   Brakenhoff, G J ^a   Müller, Michiel ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; ELECTRIC FIELD EFFECTS; HARMONIC GENERATION; IMAGE ANALYSIS; NEMATIC LIQUID CRYSTALS; OPTICAL MICROSCOPY; REFRACTIVE INDEX;

COLLOIDAL PARTICLES; LINEAR SUSCEPTIBILITY; THIRD-HARMONIC GENERATION (THG);

COLLOIDS;

EID: 33845792879     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.012976     Document Type: Article

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