First combined electron backscatter diffraction and transmission electron microscopy study of grain boundary structure of deformed quartzite

Journal of Microscopy

Volumn 224, Issue 3, 2006, Pages 306-321

  Shigematsu, N ^a   Prior, D J ^a   Wheeler, J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Dislocation; Grain boundary structure; High angle boundary; Low angle boundary; Misorientation

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAMS; QUARTZ; SCANNING ELECTRON MICROSCOPY;

DISLOCATION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; GRAIN BOUNDARY STRUCTURE; GRAIN-BOUNDARIES; HIGH ANGLE BOUNDARIES; LOW ANGLE BOUNDARIES; MISORIENTATION ANGLE; MISORIENTATIONS; QUARTZ POLYCRYSTALS;

GRAIN BOUNDARIES;

SILICON DIOXIDE;

ARTICLE; ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; PRIORITY JOURNAL; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33845792454     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01697.x     Document Type: Article

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