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Volumn 23, Issue 5, 2006, Pages 832-837

Influence of sputtering gas pressure on the LiCoO2 thin film cathode post-annealed at 400°C

Author keywords

Lithium cobalt oxide; Low temperature annealing; RF sputtering; Thin film battery

Indexed keywords


EID: 33845783717     PISSN: 02561115     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02705936     Document Type: Article
Times cited : (14)

References (19)
  • 6
    • 0032204828 scopus 로고    scopus 로고
    • Amorphous lithium cobalt and nickel oxides thin films: Preparation and characterization by RBS and PIGE
    • Benqlilou-Moudden, H., Blondiaux, G., Vinatier, P. and Levasseur, A., "Amorphous lithium cobalt and nickel oxides thin films: preparation and characterization by RBS and PIGE," Thin Solid Films, 333, 16 (1998).
    • (1998) Thin Solid Films , vol.333 , pp. 16
    • Benqlilou-Moudden, H.1    Blondiaux, G.2    Vinatier, P.3    Levasseur, A.4
  • 16
    • 0030259560 scopus 로고    scopus 로고
    • Characterization of thin-film rechargeable lithium batteries with lithium cobalt oxide cathodes
    • Wang, B., Bates, J. B., Hart, F. X., Sales, B. C., Zuhr, R. A. and Robertson, J. D., "Characterization of thin-film rechargeable lithium batteries with lithium cobalt oxide cathodes," J. Electrochem. Soc., 143, 3203 (1996).
    • (1996) J. Electrochem. Soc. , vol.143 , pp. 3203
    • Wang, B.1    Bates, J.B.2    Hart, F.X.3    Sales, B.C.4    Zuhr, R.A.5    Robertson, J.D.6
  • 18
    • 0001028586 scopus 로고    scopus 로고
    • Crystallographically oriented thin-film nanocrystalline cathode layers prepared without exceeding 300°C
    • Whitacre, J. F., West, W. C., Brandon, E. and Ratnakumar, B. V., "Crystallographically oriented thin-film nanocrystalline cathode layers prepared without exceeding 300°C," J. Electrochem. Soc., 148, A1078 (2001).
    • (2001) J. Electrochem. Soc. , vol.148
    • Whitacre, J.F.1    West, W.C.2    Brandon, E.3    Ratnakumar, B.V.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.