High pressure effects on electrical resistivity and dielectric properties of nanocrystalline SnO2

International Journal of Nanoscience

Volumn 5, Issue 4-5, 2006, Pages 471-477

  Thangadurai, P ^a   Bose, A Chandra ^a   Ramasamy, S ^a   Kesavamoorthy, R ^b   Ravindran, T R ^b  

^a UNIVERSITY OF MADRAS   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

High pressure; Impedance spectroscopy; Nanocrystalline SnO2; Raman scattering; XRD

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; HIGH PRESSURE EFFECTS; HYDROSTATIC PRESSURE; PRECIPITATION (CHEMICAL); RAMAN SCATTERING; TIN COMPOUNDS; X RAY DIFFRACTION;

DIELECTRIC MEASUREMENTS; HIGH PRESSURE RAMAN SPECTROSCOPY; IMPEDANCE SPECTROSCOPY; TRANSITION PRESSURES;

NANOSTRUCTURED MATERIALS;

EID: 33845637253     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0219581x06004656     Document Type: Conference Paper

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