Oxygen induced segregation of aluminum to α-Cu-Al(1 0 0) alloy surfaces studied by low energy ion scattering and X-ray photoelectron spectroscopy

Surface Science

Volumn 601, Issue 1, 2007, Pages 87-94

  Kravchuk, T ^a   Hoffman, A ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Cu Al alloy; Induced segregation; Low energy ion scattering (LEIS); Oxidation; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ANNEALING; COPPER ALLOYS; ELECTRON SCATTERING; OXIDATION; OXYGEN; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; BULK CONCENTRATION; INDUCED ALUMINUM SEGREGATION; LOW ENERGY ION SCATTERING (LEIS);

ALUMINUM;

EID: 33845627056     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.09.008     Document Type: Article

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