SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 601, Issue 1, 2007, Pages 58-62

AFM analysis of MgB2 films and nanostructures

(4) Portesi, C a Borini, S a Picotto, G B a Monticone, E a

a ISTITUTO NAZIONALE DI RICERCA METROLOGICA (Italy)

Author keywords

Atomic force microscopy; Magnesium diboride; Nanostructures

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRON BEAM LITHOGRAPHY; MAGNESIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; SILICON NITRIDE; SUPERCONDUCTING DEVICES; SURFACE STRUCTURE;

FILM MORPHOLOGY; MAGNESIUM DIBORIDE; NANOBRIDGES; NANOSTRUCTURATION;

THIN FILMS;

EID: 33845619541 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2006.09.004 Document Type: Article

Times cited : (9)

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